MICROTEST 7750 Impulse Winding Tester
- Lowest Inductance (≥0.1μH)
- High voltage calibration
- programmable impulse voltage
- 200MHz/9bit High Impulse Test Sampling Rate
- Total Area Comparison
- Differential Area Comparison
- Corona Comparison
- LAPLACIAN Comparison
- Voltage Compensation Function
|±（1% of setting ＋ 5V）
|±（1% of setting ＋ 10V）
|±（1% of setting ＋ 20V）
|Provides 4 waveform comparison
|Total area comparison
|When layer short happened, the loss of power on coil increase, the resonance damping coefficient increase, resonance amplitude decrease, the total area decrease. These are the basic parameters we check layer short.
By calculating and comparing the deference of area between golden sample and DUT.
Show by percentage
|Differential area comparison
|Add up the difference between normal wave and DUT wave call “ Area differential”.
When layer short happened, the inductance reduce(similar the transformer). The wave phase change and the area differential also change. This will show “fail” on the instrument.
However, the parameter might cause deviation because of the deviation of inductance, resonance phase shift. (Silicon steel product such as motor and traditional transformer is not suitable)
By calculating and comparing the deference of area between golden sample and DUT. To determine the degree of waveform overlap.
|In pulse test, the insulation defect will cause discharge and create corona. This function is able to count the times that corona happened base on the degree of deviation.
Detect the discharge phenomenon on the coil.
|Use the second derivative to calculate the Laplacian value.
By the corona waveform of high-frequency to know more about the insulating property of products.
|PLC Remote Control
|PLC Remote Output Signal
|200 sets testing waveform
|435x145x522 mm (W*H*D)
|5.7″ dot-matrix (300*240 )